Recuperar dados em hard disk com superfície com problema

Recover magnetic surfaces, that had damaged or that was erased (II)

Here something that is based in Jim Rice works he is or was involved in Nanotechnology.

NanoTools: TheHomebrew STM Page, Jim Rice, Even for a relatively inexperienced user the time to start getting images of the data on a drive platter is about 5 minutes. To start getting useful images of a particular track requires more than a passing knowledge of disk formats, but these are well-documented, and once the correct location on the platter is found a single image would take approximately 2-10 minutes depending on the skill of the operator and the resolution required. With one of the more expensive MFM's it is possible to automate a collection sequence and theoretically possible to collect an image of the entire disk by changing the MFM controller software.

There are, from manufactures sales figures, several thousand SPM's in use in the field today, some of which have special features for analyzing disk drive platters, such as the vacuum chucks for standard disk drive platters along with specialized modes of operation for magnetic media analysis. These SPM's can be used with sophisticated programmable controllers and analysis software to allow automation of the data recovery process. If commercially-available SPM's are considered too expensive, it is possible to build a reasonably capable SPM for about US$1400, using a PC as a controller...”

I also can put here another related job that is named the “Tunneling Theory”;

"ScanningTunneling Microscopy (STM) tunneling theory is quite complex, but may be simplified greatly by several approximations. STM involves the tunneling of electrons through vacuum from the tip of the STM to the sample. For simplification, this can be considered as tunneling between two metallic electrodes, separated by a vacuum region. The potential in the vacuum region acts as a barrier to electrons. In this simplified form, one can apply the trivial solution of the Schrodinger equation, applied to a rectangular barrier..."

So reading all these articles we can suppose that if IBAS can or if Action Front also can, we all can too. But in my researches I conclude that this is not for commercial jobs is not for our daily cases, this are thesis this are scientific jobs to be done “ÏN LABORATORIUN” all this are wonderful but not practical, you cannot use this kind of things to read a 80gb disk with 40gb data inside. I also believe that people or better saying companies that work with Forensics can use this technics but not DR people.

Here is part of something that I found has a long time ago, just read it and them come back to the begun of Dr.Peter words and you will understand a little bit more.

“In the early 1980's two IBM scientists, Binnig & Rohrer developed a new technique for studying surface structure - Scanning Tunneling Microscopy (STM). This invention was quickly followed by the development of a whole family of related techniques which, together with STM, may be classified in the general category of Scanning Probe Microscopy (SPM) techniques. Of these later techniques, the most important is Atomic Force Microscopy...”

Also one interesting part of all this things that you are seeing above is that has people that use this articles to say that erase is needed because people will recover files that everybody think that is impossible otherwise has people that uses same words to say that they will use this tech to do data recover. Fanny but they have same objective they are doing advertise of their job.

Anyway here has a little bit more of this tech "Scanning probe microscopy is a branch of microscopy that was founded with the invention of the scanning tunneling microscope. It is a microscopy technique where a probe only has a significant interaction with a very small volume of the sample specimen. An image of the sample is obtained by mechanically moving the probe with respect to the sample so that the sample is scanned line by line, and recording the probe-sample interaction as a function of position."

 Escrito por Jose Pinto em Abril de 2007